Raman-AFM system

Renishaw have added Bruker’s Dimension Icon atomic force microscope to the range of instruments supported by their inVia confocal Raman microscope. The combined instrument has a flexible arm linking the two instruments, which couples light between them with mirrors. The arm uses Renishaw’s StreamLineHR high-resolution mapping technology that can map areas up to 500 µm × 500 µm, with position encoders ensuring 100-nm repeatability. Bruker’s PeakForce QNM complements StreamLineHR by providing even higher resolution nano-mechanical information.