WITec has enhanced its ParticleScout automated particle analysis tool to offer greater speed and versatility for finding, classifying and identifying microparticles. ParticleScout now includes integration time optimisation that uses the signal-to-noise ratio to determine how long each particle is measured for identification. This not only greatly reduces overall measurement time, but also minimises the effects of fluorescence. It also has added image processing features such as vignetting correction, smart zoom that displays particle information dynamically depending on viewed area and multiple sample area targeting. These are complemented by the integration and possible combination of dark-field, bright-field, epifluorescence and transmission sample illumination.
A software routine has been introduced to accelerate measurements of round samples such as filters that contain homogeneously distributed particles. It allows a wedge section to be selected for analysis and the results can then be extrapolated to represent the whole. Another innovation is the smart separation of closely adjacent or touching particles. This is especially useful for densely packed, heterogeneous samples.
Data post-processing with WITec’s TrueMatch™ Raman database management software is updated as well, including the ability to identify individual components in mixed spectra. Hit quality index (HQI) calculation is also optimised with automatic noise reduction and substrate spectra removal. Together these advances enable a new degree of precision in sample characterisation. The quantitative report that summarises the results of a ParticleScout investigation can now be formatted with pre-configured templates such as tables, bar graph histograms or pie charts for clear and effective data presentation.
