Princeton Instruments has introduced 532-nm Raman accessories for its FERGIE spectrometer product line. Raman measurements at 532 nm offer better sensitivity with a higher Raman cross-section (\(\sigma \propto \frac{1}{{{\lambda ^4}}}\)) compared to Raman measurements at 785 nm or longer wavelengths. The 532 nm excitation wavelength also delivers higher spatial resolution for Raman microscopy measurements, making it ideal for carbon materials (e.g., graphene and carbon nanotubes) and other thin film material characterisation. In contrast, the 785-nm excitation wavelength is preferred for organic and biological samples that have fluorescence background.
