Atomic force microscopy
It is possible to obtain both infrared spectra and thermal analysis data of individual layers in a cross-sectioned multilayer film. Since both techniques are AFM-based, the topographical features can be readily linked to the spectroscopic and thermal data at a much higher spatial resolution than previously achievable.
WITec is a manufacturer of high-resolution optical & scanning probe microscopy solutions for scientific and industrial applications. A modular product line allows the combination of different techniques such as Raman, NSOM or AFM in one instrument. The alpha300 and 500 series enable true 3D chemical imaging.