Overcoming matrix effects with XRF

Spectro have published a white paper explaining why overcoming matrix effects associated with X-ray fluorescence (XRF) analysis is critical to achieving consistent high-accuracy results. Mitigating Matrix Effects with Advanced Spectra-Handling Functionality When Using XRF for High-Accuracy Elemental Analysis is available to download. A great advantage of energy dispersive X-ray fluorescence (ED-XRF) analysis for rapid screening analysis is its ability to measure samples directly with a minimum of preparation. Realising this benefit, however, requires eliminating potential errors that can result when atoms in the sample matrix influence the fluorescence of others and thus the intensities measured by the spectrometer are influenced. Such effects, which include absorption and enhancement, when taken collectively, are referred to generally as matrix effects. For quality control applications, when the sample matrix is known or can be matched, a variety of standards-based XRF calculation procedures are available to compensate for undesirable matrix effects.
However, creating the right basis for consistently high-accuracy results requires additional spectra handling functionality to determine the correct net intensities of the measured spectra. The new white paper explains why this additional functionality is a critical aspect of overcoming matrix effects and ensuring those consistently high-accuracy results.
Spectro
link.spectroscopyeurope.com/28-01-122

Spectro

link.spectroscopyeurope.com/28-01-122

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