FAST SDD with Moisture Resistant Windows
Amptek’s line of silicon drift detectors is now available for use for energy dispersive spectroscopy (EDS) within scanning electron microscopes (SEMs). With the “C Series” silicon nitride X-ray windows, the low-energy response extends down to boron. SEM-EDS is an ideal application for these detectors because the electrons have a short range in the sample and they excite the X-rays very close to the surface, yielding many X-rays from all the elements down to carbon, benefitting from the high efficiency of these windows at low energies.
Bench-top ED XRF spectrometer suitable for industrial applications, where the 20-position sample tray or automation interface to a conveyor belt will be valuable, or as a flexible tool for the academic and research environment, since it can accept a wide range of sample types, shapes and sizes. The measurement spot can be changed from a couple of centimetres to a few millimetres, and a video camera aids exact sample positioning.
Process XRD system for analysis of polycrystalline material that succeeds the D4 Endeavor. 1-dimensional detector technology enables short measurement times whilst maintaining sensitivity for the detection of crystallographic phases with low concentrations. Conveyor belt or external robot interface are available for automated sample loading, and measurement can continue whilst single samples or sample trays are loaded manually.
ED XRF spectrometer that enables high-sensitivity analyses to be performed across the entire energy range using a maximum of nine types of filters and a sample chamber vacuum unit. It has a 12-position auto sample changer, touch screen operation, pre-recorded recipes for standard solution applications (RoHS, metals, oxides, organic materials), a high sensitivity SDD and short-path optical system for high throughput, and residual balance and thickness correction for organic samples.
Fusion system for making beads for XRF analysis that incorporates a loss-on-ignition (LOI) analyser. An external balance weighs the crucible, sample and flux, and an internal balance below the furnace that is used for LOI calculations. This simplifies the bead making process and makes it less dependent on the individual operator. Versions are available to handle form two to eight beads, and expansion is easily.
X-ray fluorescence spectrometer that has both wavelength dispersive and energy dispersive cores integrated by SumXcore technology in one instrument, which can also include a small spot analysis tool for fast element distribution mapping and the THETA free lime channel for dedicated cement applications. Measuring ED and WD simultaneously cuts the experimental time in half. A series of dedicated Zetium editions are available: cement, polymers, petro, metals and minerals, as well as an “Ultimate” edition. Each is available with a choice of four enhanced performance packages for improved speed and throughput, performance enhancement, robustness and uptime, and flexibility.
New detector for X-ray diffraction with resolution comparable to the PIXcel3D and with pixel dimensions of 60 × 60 µm and overall sensor dimension of 30.7 × 24.8 mm. The CdTe sensor provides high stopping power for X-rays, improving the detector efficiency for all laboratory wavelengths, and enabling close to 100% efficiency for higher radiation such as Ag and Mo.
NEX QC Quant EZ Series
Low-cost, high-resolution bench-top ED XRF analysers designed for heavy industrial use. QuantEZ analytical software runs on either a laptop or benchtop PC and offers all the functions required for calibration and routine maintenance. The NEX QC QuantEZ version is optimised for routine QC and the NEX QC+ QuantEZ version for more demanding applications where analysis time and sample throughput are important. The QC+ uses silicon drift detector technology.