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How a cat manages to turn and land on its feet may not be the most obvious start to an article in Spectroscopy Europe. However, C.J. Milne and M. Chergui use the example in their article on “Time-resolved X-ray absorption spectroscopy” to show how the time dimension is important in many analyses and applications. There has been a real surge in time-resolved X-ray absorption studies in chemistry, biology and materials science. Picosecond time resolution is routinely achieved and femtosecond resolution has been demonstrated at synchrotrons, albeit at the cost of a significantly reduced photon flux. However, the advent of hard X-ray-free electron lasers offer the promise of making such studies routine.
An important use of Raman spectroscopy to help understand the impact of traffic on roadside soils and plants
Even though lead in fuel has been banned for a number of years, it is still present in by the roadside, as are many other pollutants from vehicles. The combination of Raman spectroscopy and µ-ED-XRF is of particular value. The advantage Raman has is in the possibility of focusing on individual grains, thereby obtaining the spectrum of each grain that comes from traffic-emitted particles.
The study of dust particles in our atmosphere is important since they can act as a suppresor of global warming. The analysis of historical levels of dust in the atmosphere through ice cores is vital in this work. Synchrotron-radiation spectroscopic techniques such as TXRF and XANES can be used to analyse extremely small amounts of dust.
Whilst fireworks are a great entertainment, they can also be used for illegal activities as well as potentially containing dangerous chemicals. The combination of Raman spectroscopy and SEM-EDS turns out to be a very efficient analytical method. In fact, these complementary techniques may also be used to analyse other kinds of pyrotechnic artefacts, low explosive formulations, high explosives, explosion residues etc.
Next generation hand-held energy dispersive X-ray fluorescence spectrometer in a smaller, lightweight package offering improved analytical performance. Designed for high-throughput elemental testing and spectrochemical analysis of a wide range of metals.
An X-ray coating analysis software module for the Orbis line of micro-XRF analysers, enabling them to provide simultaneous multi-layer film thickness and composition analyses for metal, oxide, nitride and carbide coatings as well as coatings that contain elements within the observable range of the Orbis system.
The latest addition to this series has been optimised for the analysis of medium and heavy elements and was designed specifically for laboratories conducting environmental, geological and waste disposal analysis. It features a flexible excitation source, has a stable end-window tube with a power of only 50 W, a target changer with up to eight polarisation and secondary targets and is equipped with a large area SDD detector.
A low-cost benchtop energy dispersive X-ray fluorescence spectrometer with variable analysis spot size which delivers rapid quantitative determination of sodium to uranium in solids, liquids, powders and thin films which has been specifically designed to serve the RoHS and jewellery markets.
Next generation of Amptek’s Silicon Drift Detector (SDD). The noise corner of the new detector is at 1 µs peaking time vs >10 µs for the standard unit, providing ×10 the throughput with no loss of resolution.
Industrial environments pose potentially hazardous situations whereby workers may be exposed to various airborne toxic elements in their breathing zone. One of the main aerosol fractions of interest is welding fume, which can be determined with XRF spectrometry.
For the past 30 years, one of the most valuable and widely used techniques for studying electronic structures has been Angle-Resolved PhotoEmission Spectroscopy (ARPES). However, this technique primarily looks at surfaces. Now, for the first time, bulk electronic structures have been opened to comparable scrutiny through a new variation of this standard called Hard x-ray Angle-Resolved PhotoEmission Spectroscopy (HARPES).
Thermo Fisher Scientific has announced a new addition to its range of automated optical emission and X-ray fluorescence spectrometers. Specially designed for high-speed production control laboratories in the iron and steel industry, the ARL SMS-2500 automation solution provides increased sample turnaround through a tighter integration of sample preparation with the use of a larger, stronger and faster robot. The system uses reliable components to ensure increased system uptime, including vision system, sample labelling, radioactivity measurement and fixed magazine for standards. The robot has an arm length of 902 mm with a gripper and six moving axes. It is designed to handle heavy loads of up to 5 kg in industrial environments with high precision. All system components operate simultaneously for optimal efficiency, while sample priority management, temporary sample storage and rapid transfer between system components allows for short sample turnaround.
A new version of the K-Alpha X-ray photoelectron spectrometer is available from Thermo Fisher Scientific. This integrated surface characterisation tool is designed for surface engineers, whether working in cutting-edge research and developement of new surface chemistries or dealing with routine characterisation of surfaces, thin films and coatings. The new instrument combines improved spectrometer performance with the latest version of Avantage XPS acquisition and processing user interface to produce high sample throughput and performance. The high level of integration between hardware and software enables users to calibrate their instrument with a single button press and incorporates full traceability of all system parameters.
Thermo Fisher Scientific
Thermo Fisher Scientific has launched an integrated solution for the metals industry combining wavelength dispersive X-ray fluorescence with optical emission spectrometry. The solution optimises the ARL Optim'x WDXRF slag analyser in combination with the ARL 3460 Advantage OES metals analyser. This pairing offers foundries and metal processing companies effective analyses of metallurgic slags and alloys by WDXRF and quick, accurate investigation of solid metals by OES. This new product offers primary and secondary metals producers the opportunity to utilise two techniques at once and easily undertake quality analysis.
Thermo Fisher Scientific