Carl Zeiss has launched a new field emission scanning electron microscope. The Merlin combines the contradictory requirements of ultra-high resolution imaging and analytical capabilities and supports the user with a wide range of detailed solutions for tasks that could not be performed in the past. This has been achieved by the company's complete detection system which consists of an in-lens SE detector for surface imaging, an in-lens EsB detector for material contrast and an AsB detector for widely dispersed backscattered electrons which contains specific information on the crystal orientation of samples. The electronic system permits flexible instrument configuration. Additional detectors can be retrofitted quickly to adapt the system for growing requirements.